@conference {xu2009impact,
	title = {Impact of Thickness and Deposition Temperature of Gate Dielectric on Valence Bands in Silicon Nanowires},
	booktitle = {2009 International Conference on Simulation of Semiconductor Processes and Devices},
	year = {2009},
	pages = {1{\textendash}4},
	publisher = {IEEE},
	organization = {IEEE},
	author = {Xu, Honghua and He, Yuhui and Chun Fan and Yuning Zhao and Gang DU and Kang, Jinfeng and Han, Ruqi and Liu, Xiaoyan}
}
